REF5020-Q1, REF5025-Q1, REF5030-Q1

REF5040-Q1, REF5045-Q1, REF5050-Q1

SBOS456G – SEPTEMBER 2008 – REVISED OCTOBER 2013

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

REF50xx

PARAMETER

MIN

MAX

UNIT

Input voltage

18

V

Output short-circuit

30

mA

Operating temperature range

–40

125

°C

Storage temperature range

–65

150

°C

150

°C

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

ESD RATINGS

Over operating free-air temperature range (unless otherwise noted).

PARAMETER

VALUE

UNIT

REF5020AQDRQ1

500

REF5030AQDRQ1

1000

Human Body Model (HBM)

REF5040AQDRQ1

500

V

ESD

REF5045AQDRQ1

1000

REF5050AQDRQ1

500

Machine Model (MM)

200

V

Charged-Device Model (CDM)

1000

V

2

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