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CBTL04DP211 Fiches technique(PDF) 7 Page - NXP Semiconductors

No de pièce CBTL04DP211
Description  DisplayPort 2 : 1 multiplexer
PDF  18 Pages
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Fabricant  NXP [NXP Semiconductors]
Site Internet  http://www.nxp.com
Logo NXP - NXP Semiconductors

CBTL04DP211 Fiches technique(HTML) 7 Page - NXP Semiconductors

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CBTL04DP211
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2012. All rights reserved.
Product data sheet
Rev. 2 — 13 April 2012
7 of 18
NXP Semiconductors
CBTL04DP211
DisplayPort 2 : 1 multiplexer
8.
Limiting values
[1]
Human Body Model: ANSI/EOS/ESD-S5.1-1994, standard for ESD sensitivity testing, Human Body Model -
Component level; Electrostatic Discharge Association, Rome, NY, USA.
[2]
Charged Device Model: ANSI/EOS/ESD-S5.3-1-1999, standard for ESD sensitivity testing, Charged Device
Model - Component level; Electrostatic Discharge Association, Rome, NY, USA.
9.
Recommended operating conditions
[1]
HPD input is tolerant to 5 V input, provided a 1 k
Ω series resistor between the voltage source and the pin is
placed in series. See Section 11.1 “Special considerations”.
[2]
AUX input is tolerant to 5 V input, provided a 2.2 k
Ω series resistor between the voltage source and the pin
is placed in series. See Section 11.1 “Special considerations”.
Table 6.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max
Unit
VDD
supply voltage
−0.3
+5
V
Tcase
case temperature
−40
+85
°C
VESD
electrostatic discharge
voltage
HBM
[1] -
8000
V
HBM; CMOS inputs
[1] -
2000
V
CDM
[2] -
1000
V
CDM; CMOS inputs
[2]
500
V
Table 7.
Recommended operating conditions
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VDD
supply voltage
3.0
3.3
3.6
V
VI
input voltage
CMOS inputs
−0.3
-
VDD +0.3
V
Main Link
−0.3
-
VDD +0.3
V
HPD inputs
[1]
−0.3
-
VDD +0.3
V
AUX
[2]
−0.3
-
VDD +0.3
V
Tamb
ambient temperature
operating in free air
−40
-
+85
°C



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