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CX103 Fiches technique(PDF) 2 Page - STATEK CORPORATION |
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CX103 Fiches technique(HTML) 2 Page - STATEK CORPORATION |
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2 / 2 page ![]() HOW TO ORDER CX103 LEADED CRYSTAL CX1 S C 03 — 1.0M, 500 / I STATEK CORPORATION 512 N. MAIN ST., ORANGE, CA 92868 714-639-7810 FAX: 714-997-1256 www.statek.com 10130 - Rev E PACKAGING Tray Pack TYPICAL APPLICATION FOR A PIERCE OSCILLATOR The low profile CX miniature leaded crystal is ideal for small, high density, battery operated portable products. The CX crystal designed in a Pierce oscillator (single inverter) circuit provides very low current consumption and high stability. A conventional CMOS Pierce oscillator circuit is shown below. The crystal is effectively inductive and in a PI-network circuit with CD and CG provides the additional phase shift necessary to sustain oscillation. The oscillation frequency (f0) is 15 to 150 ppm above the crystal’s series resonant frequency (fs). Drive Level RA is used to limit the crystal’s drive level by forming a voltage divider between RA and CD. RA also stabilizes the oscillator against changes in the amplifiers output resistance (R0). RA should be increased for higher voltage operation. Load Capacitance The CX crystal calibration tolerance is influenced by the effective circuit capacitances, specified as the load capacitance (CL). CL is approximately equal to: NOTE: CD and CG include stray layout to ground and Cs is the stray shunt capacitance between the crystal terminal. In practice, the effective value of CL will be less than that calculated from CD, CG and CS values because of the effect of the amplifier output resistance. CS should be minimized. The oscillation frequency (f0) is approximately equal to: CL = CD x CG + CS CD + CG (1) f0 = fS [1+ C1 ] 2(C0 + CL) (2) Where f S = Series resonant frequency of the crystal C1 = Motional Capacitance C0 = Shunt Capacitance AMPLIFIER BUFFER CG CD RA CX1 Contact factory for design guidelines OSC Freq (f ) O Rf CS CONVENTIONAL CMOS PIERCE OSCILLATOR CIRCUIT “S” if special or custom design. Blank if Std. Blank = Glass Lid C = Ceramic Lid Frequency K = kHz M = MHz Calibration Tolerance @ 25OC (in ppm) Operating Temp. Range: C = -10OC to +70OC I = -40OC to +85OC M = -55OC to +125OC S = Customer Specified 03 05 - (lead free) SPECIFICATIONS Specifications are typical at 25OC unless otherwise noted. Specifications are subject to change without notice. Parameters Fundamental Overtone Frequency Range, (Hz) 555 k 614 k 1.0 M 1.4 M 1.8432 M 2.1M Motional Resistance,R1(Ω) 600 275 500 775 300 475 Motional Resistance,R1 MAX 3 kΩ Motional Capacitance,C1 (fF) 2.5 3.6 2.0 1.5 2.8 2.6 Quality Factor, Q (k) 170 260 190 100 110 70 Shunt Capacitance,C0 (pF) 1.2 1.3 1.1 1.0 1.3 1.3 Calibration Tolerance1 500 ppm (0.05%) 1000 ppm (0.1%) 10000 ppm (1.0%) Drive Level 3 µW MAX Load Capacitance2 7 pF Turning Point (T0)2 35OC Temperature Coefficient (k) -0.035 ppm/OC2 Note: Frequency f at temperature T is related to frequency f0 at turning point temperature T0 by: Function Mode Extensional Aging, first year 5 ppm MAX Shock, survival 750 g, 0.3 ms, 1/2 sine Vibration, survival 10 g RMS, 20-1,000 Hz random Operating Temp. Range -10OC to +70OC (Commercial) -40OC to +85OC (Industrial) -55OC to +125OC (Military) Storage Temp. Range -55OC to +125OC Max Process Temperature 260OC for 20 sec. 1. Tighter tolerances available. 2. Other values available. + _ + _ + _ f-f0 = k(T-T 0) 2 f0 |
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