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AM29SL800C Fiches technique(PDF) 26 Page - Advanced Micro Devices |
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AM29SL800C Fiches technique(HTML) 26 Page - Advanced Micro Devices |
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26 / 41 page ![]() 26 Am29SL800C PR EL I M I NAR Y TEST CONDITIONS Table 7. Test Specifications KEY TO SWITCHING WAVEFORMS CL Device Under Test 22230A-15 Figure 11. Test Setup Test Condition 100 120, 150 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–2.0 V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 2.0 V 0.0 V 1.0 V 1.0 V Output Measurement Level Input 22230A-16 Figure 12. Input Waveforms and Measurement Levels |
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