AM29F100T-120DPC datasheet(6/8 Pages) AMD

No de pièce	AM29F100T-120DPC

Description	1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory-Die Revision 1

PDF	8 Pages

Scroll/Zoom	100%

Fabricant	AMD [Advanced Micro Devices]

Site Internet	http://www.amd.com

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6 / 8 page

Am29F100 Known Good Die

SU PP L E ME NT

PRODUCT TEST FLOW

Figure 1 provides an overview of AMD’s Known Good

Die test flow. For more detailed information, refer to the

Am29F100 product qualification database supplement

for KGD. AMD implements quality assurance proce-

dures throughout the product test flow. In addition, an

off-line quality monitoring program (QMP) further guar-

antees AMD quality standards are met on Known Good

Die products. These QA procedures also allow AMD to

produce KGD products without requiring or imple-

menting burn-in.

Figure 1.

AMD KGD Product Test Flow

Wafer Sort 1

Bake

24 hours at 250

°C

Wafer Sort 2

Wafer Sort 3

High Temperature

Packaging for Shipment

Shipment

DC Parameters

Functionality

Programmability

Erasability

Data Retention

DC Parameters

Functionality

Programmability

Erasability

DC Parameters

Functionality

Programmability

Erasability

Speed

Incoming Inspection

Wafer Saw

Die Separation

100% Visual Inspection

Die Pack

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