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GAL22V10D-25LS Fiches technique(PDF) 11 Page - Lattice Semiconductor |
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GAL22V10D-25LS Fiches technique(HTML) 11 Page - Lattice Semiconductor |
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11 / 23 page ![]() Specifications GAL22V10 9 tpd A Input or I/O to Comb. Output 1 10 3 15 3 20 3 25 ns tco A Clock to Output Delay 1 7 2 8 2 10 2 15 ns tcf2 — Clock to Feedback Delay — 2.5 — 2.5 — 8 — 13 ns tsu — Setup Time, Input or Fdbk before Clk↑ 6 — 10 — 12 — 15 — ns th — Hold Time, Input or Fdbk after Clk↑ 0— 0— 0 — 0 — ns A Maximum Clock Frequency with 83.3 — 55.5 — 41.6 — 33.3 — MHz External Feedback, 1/(tsu + tco) fmax3 A Maximum Clock Frequency with 110 — 80 — 45.4 — 35.7 — MHz Internal Feedback, 1/(tsu + tcf) A Maximum Clock Frequency with 125 — 83.3 — 50 — 38.5 — MHz No Feedback twh — Clock Pulse Duration, High 4 — 6 — 10 — 13 — ns twl — Clock Pulse Duration, Low 4 — 6 — 10 — 13 — ns ten B Input or I/O to Output Enabled 1 10 3 15 3 20 3 25 ns tdis C Input or I/O to Output Disabled 1 9 3 15 3 20 3 25 ns tar A Input or I/O to Asynch. Reset of Reg. 1 13 3 20 3 25 3 25 ns tarw — Asynch. Reset Pulse Duration 8 — 15 — 20 — 25 — ns tarr — Asynch. Reset to Clk↑ Recovery Time 8 — 10 — 20 — 25 — ns tspr — Synch. Preset to Clk↑ Recovery Time 8 — 10 — 14 — 15 — ns Specifications GAL22V10D -10 MIN. MAX. -25 MIN. MAX. -20 MIN. MAX. -15 MIN. MAX. Over Recommended Operating Conditions UNITS 1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Description section. 3) Refer to fmax Description section. SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS C I Input Capacitance 8 pF V CC = 5.0V, VI = 2.0V C I/O I/O Capacitance 8 pF V CC = 5.0V, VI/O = 2.0V *Characterized but not 100% tested. PARAM. TEST COND.1 DESCRIPTION COM / IND IND COM / IND COM / IND Capacitance (T A = 25 °C, f = 1.0 MHz) AC Switching Characteristics |
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