| Moteur de recherche de fiches techniques de composants électroniques |
|
AD5258BRMZ1-R7 Fiches technique(PDF) 13 Page - Analog Devices |
|
|
|||||||||||||||||||||||||||||
AD5258BRMZ1-R7 Fiches technique(HTML) 13 Page - Analog Devices |
|
13 / 24 page ![]() Data Sheet AD5258 Rev. D | Page 13 of 24 TEST CIRCUITS Figure 30 through Figure 35 illustrate the test circuits that define the test conditions used in the product specification tables. VMS A W B DUT V+ V+ = VDD 1LSB = V+/2N Figure 30. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL) NO CONNECT IW VMS A W B DUT Figure 31. Test Circuit for Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) VMS2 VMS1 VW A W B DUT IW = VDD/RNOMINAL RW = [VMS1 – VMS2]/IW Figure 32. Test Circuit for Wiper Resistance DUT A W B V+ ΔVMS% ΔVDD% ΔVDD VA VMS V+ = VDD ± 10% PSSR (%/%) = Figure 33. Test Circuit for Power Supply Sensitivity (PSS, PSSR) +5V –5V W A +2.5V B VOUT OFFSET GND DUT AD8610 VIN Figure 34. Test Circuit for Gain vs. Frequency W B DUT ISW ISW RSW GND TO VDD CODE = 0x00 = 0.1V 0.1V Figure 35. Test Circuit for Common-Mode Leakage Current |
|
Lien URL |
| ALLDATASHEET vous a-t-il été utile ? [ DONATE ] |
À propos de Alldatasheet | Publicité | Contactez-nous | Politique de confidentialité | Lien vers la fiche technique | Echange de liens | Fabricants All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |