Moteur de recherche de fiches techniques de composants électroniques
  French  ▼
ALLDATASHEET.FR

X  

ADAS3023BCPZ Fiches technique(PDF) 9 Page - Analog Devices

No de pièce ADAS3023BCPZ
Description  16-Bit, 8-Channel Simultaneous Sampling Data Acquisition System
PDF  32 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricant  AD [Analog Devices]
Site Internet  http://www.analog.com
Logo AD - Analog Devices

ADAS3023BCPZ Fiches technique(HTML) 9 Page - Analog Devices

Back Button ADAS3023BCPZ Datasheet HTML 5Page - Analog Devices ADAS3023BCPZ Datasheet HTML 6Page - Analog Devices ADAS3023BCPZ Datasheet HTML 7Page - Analog Devices ADAS3023BCPZ Datasheet HTML 8Page - Analog Devices ADAS3023BCPZ Datasheet HTML 9Page - Analog Devices ADAS3023BCPZ Datasheet HTML 10Page - Analog Devices ADAS3023BCPZ Datasheet HTML 11Page - Analog Devices ADAS3023BCPZ Datasheet HTML 12Page - Analog Devices ADAS3023BCPZ Datasheet HTML 13Page - Analog Devices Next Button
Zoom Inzoom in Zoom Outzoom out
 9 / 32 page
background image
Data Sheet
ADAS3023
ABSOLUTE MAXIMUM RATINGS
Table 4.
Parameter
Rating
Analog Inputs/Outputs
INx, COM to AGND
VSSH − 0.3 V to VDDH + 0.3 V
REFx to AGND
AGND − 0.3 V to AVDD + 0.3 V
REFIN to AGND
AGND − 0.3 V to +2.7 V
REFN to AGND
±0.3 V
Ground Voltage Differences
AGND, RGND, DGND
±0.3 V
Supply Voltages
VDDH to AGND
–0.3 V to +16.5 V
VSSH to AGND
+0.3 V to −16.5 V
AVDD, DVDD, VIO to AGND
−0.3 V to +7 V
ACAP, DCAP, RCAP to AGND
−0.3 V to +2.7 V
Digital Inputs/Outputs
CNV, DIN, SCK, RESET, PD, CS
to DGND
−0.3 V to VIO + 0.3 V
SDO, BUSY/SDO2 to DGND
−0.3 V to VIO + 0.3 V
Internal Power Dissipation
2 W
Junction Temperature
125°C
Storage Temperature Range
−65°C to +125°C
Thermal Impedance
θJA (LFCSP)
44.1°C/W
θJC (LFCSP)
0.28°C/W
ESD CAUTION
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Rev. 0 | Page 9 of 32



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32


Fiches technique Télécharger

Go To PDF Page


Lien URL



ALLDATASHEET vous a-t-il été utile ?  [ DONATE ] 

À propos de Alldatasheet   |   Publicité   |   Contactez-nous   |   Politique de confidentialité   |   Lien vers la fiche technique    |   Echange de liens   |   Fabricants
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com