 2012 Microchip Technology Inc.

DS25135A-page 21

SST25PF020B

TABLE 5-4:

Parameter

Description

Test Condition

Maximum

1

Output Pin Capacitance

12 pF

1

Input Capacitance

6 pF

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

TABLE 5-5:

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Minimum Specification

Units

Test Method

1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Endurance

10,000

Cycles

JEDEC Standard A117

1

Data Retention

100

Years

JEDEC Standard A103

1

Latch Up

mA

JEDEC Standard 78

TABLE 5-6:

AC OPERATING CHARACTERISTICS, 2.3-2.7V

Symbol

Parameter

25 MHz

50 MHz

Units

MinMax

MinMax

1

1. Maximum clock frequency for Read instruction, 03H, is 25 MHz

Serial Clock Frequency

25

50

MHz

Serial Clock High Time

18

9

ns

Serial Clock Low Time

18

9

ns

Serial Clock Rise Time (Slew Rate)

0.1

0.1

V/ns

Serial Clock Fall Time (Slew Rate)

0.1

0.1

V/ns

2

2. Relative to SCK

CE# Active Setup Time

55

ns

2

CE# Active Hold Time

55

ns

2

CE# Not Active Setup Time

55

ns

2

CE# Not Active Hold Time

55

ns

CE# High Time

50

50

ns

CE# High to High-Z Output

77

ns

SCK Low to Low-Z Output

00

ns

Data In Setup Time

22

ns

Data In Hold Time

44

ns

HOLD# Low Setup Time

55

ns

HOLD# High Setup Time

55

ns

HOLD# Low Hold Time

55

ns

HOLD# High Hold Time

55

ns

HOLD# Low to High-Z Output

77

ns

HOLD# High to Low-Z Output

77

ns

Output Hold from SCK Change

00

ns

Output Valid from SCK

12

8

ns

Sector-Erase

25

25

ms

Block-Erase

25

25

ms

Chip-Erase

50

50

ms

Byte-Program

10

10

µs