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Moteur de recherche de fiches techniques de composants électroniques |
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Moteur de recherche de fiches techniques de composants électroniques |
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04023D103MAT2A Fiches technique(PDF) 2 Page - AVX Corporation |
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04023D103MAT2A Fiches technique(HTML) 2 Page - AVX Corporation |
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2 / 3 page  25 X5R Dielectric Specifications and Test Methods Parameter/Test X5R Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +85ºC Temperature Cycle Chamber Capacitance Within specified tolerance ≤ 2.5% for ≥ 50V DC rating Freq.: 1.0 kHz ± 10% Dissipation Factor ≤ 3.0% for 25V DC rating Voltage: 1.0Vrms ± .2V ≤ 12.5% Max. for 16V DC rating and lower For Cap > 10 μF, 0.5Vrms @ 120Hz Contact Factory for DF by PN Insulation Resistance 10,000MΩ or 500MΩ - μF, Charge device with rated voltage for whichever is less 120 ± 5 secs @ room temp/humidity Charge device with 300% of rated voltage for Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Appearance No defects Deflection: 2mm Capacitance Test Time: 30 seconds Resistance to Variation ≤ ±12% Flexure Dissipation Meets Initial Values (As Above) Stresses Factor Insulation ≥ Initial Value x 0.3 Resistance Solderability ≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC with fresh solder for 5.0 ± 0.5 seconds Appearance No defects, <25% leaching of either end terminal Capacitance Variation ≤ ±7.5% Dip device in eutectic solder at 260ºC for 60 Dissipation Meets Initial Values (As Above) seconds. Store at room temperature for 24 ± 2 Resistance to Factor hours before measuring electrical properties. Solder Heat Insulation Meets Initial Values (As Above) Resistance Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes Capacitance Variation ≤ ±7.5% Step 2: Room Temp ≤ 3 minutes Dissipation Meets Initial Values (As Above) Step 3: +85ºC ± 2º 30 ± 3 minutes Thermal Factor Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes Resistance Dielectric Meets Initial Values (As Above) Repeat for 5 cycles and measure after Strength 24 ± 2 hours at room temperature Appearance No visual defects Capacitance Variation ≤ ±12.5% Dissipation ≤ Initial Value x 2.0 (See Above) Load Life Factor Insulation ≥ Initial Value x 0.3 (See Above) Resistance Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Capacitance Variation ≤ ±12.5% Load Dissipation ≤ Initial Value x 2.0 (See Above) Humidity Factor Insulation ≥ Initial Value x 0.3 (See Above) Resistance Dielectric Meets Initial Values (As Above) Strength Charge device with 1.5X rated voltage in test chamber set at 85ºC ± 2ºC for 1000 hours (+48, -0). Note: Contact factory for *optional specification part numbers that are tested at < 1.5X rated voltage. Remove from test chamber and stabilize at room temperature for 24 ± 2 hours before measuring. Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature and humidity for 24 ± 2 hours before measuring. 1mm/sec 90 mm |
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