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CDCUN1208LP Fiches technique(PDF) 14 Page - Texas Instruments |
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CDCUN1208LP Fiches technique(HTML) 14 Page - Texas Instruments |
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14 / 43 page ![]() Oscilloscope CH1 CH2 50 W LVDS 100 W High Impedance Probes 50 W 50 W SMA (2) Cable PCB Trace LVDS Oscilloscope CH1 CH2 50 W 50 W 50 W LVDS Spec Analyzer RF (3) SMA (2) Cable BALUN SMA SMA (2) PCB Trace Cable 50 W 50 W 50 W 50 W 50 W Oscilloscope CH1 CH2 (2) 33.1 W(2) 50 W 2 pF (2) HCSL High Impedance Probes 50 W 50 W CDCUN1208LP SCAS928 – MAY 2012 www.ti.com TEST CONFIGURATIONS Figure 9. CDCUN1208LP LVDS Output - Test Setup Figure 10. CDCUN1208LP LVDS Output - Propagation Delay/Skew Measurement Setup Figure 11. CDCUN1208LP LVDS Output - Phase Noise/Jitter Measurement Setup Figure 12 shows the configuration used to measure the HCSL buffer characteristics. Either single ended probes with math or differential probes can be used for differential measurements. The 50 Ω differential trace length is up to 15 inches. Figure 12. CDCUN1208LP HCSL Output – Measurement Configuration with Load 14 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Link(s) :CDCUN1208LP |
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