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CBTL06DP211EE Fiches technique(PDF) 8 Page - NXP Semiconductors

No de pièce CBTL06DP211EE
Description  DisplayPort Gen1 2 : 1 multiplexer
PDF  18 Pages
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Fabricant  NXP [NXP Semiconductors]
Site Internet  http://www.nxp.com
Logo NXP - NXP Semiconductors

CBTL06DP211EE Fiches technique(HTML) 8 Page - NXP Semiconductors

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CBTL06DP211
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 1 — 21 February 2011
8 of 18
NXP Semiconductors
CBTL06DP211
DisplayPort Gen1 2 : 1 multiplexer
8.
Limiting values
[1]
Human Body Model: ANSI/EOS/ESD-S5.1-1994, standard for ESD sensitivity testing, Human Body Model -
Component level; Electrostatic Discharge Association, Rome, NY, USA.
[2]
Charged-Device Model: ANSI/EOS/ESD-S5.3-1-1999, standard for ESD sensitivity testing,
Charged-Device Model - Component level; Electrostatic Discharge Association, Rome, NY, USA.
9.
Recommended operating conditions
[1]
HPD input is tolerant to 5 V input, provided a 1 k
Ω series resistor between the voltage source and the pin is
placed in series. See Section 11.1 “Special considerations”.
[2]
DDC/AUX inputs are tolerant to 5 V input, provided a 2.2 k
Ω series resistor between the voltage source and
the pin is placed in series. See Section 11.1 “Special considerations”.
Table 7.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max
Unit
VDD
supply voltage
−0.3
+5
V
Tcase
case temperature
−40
+85
°C
VESD
electrostatic discharge
voltage
HBM
[1] -
8000
V
HBM; CMOS inputs
[1] -
2000
V
CDM
[2] -
1000
V
CDM; CMOS inputs
[2]
500
V
Table 8.
Recommended operating conditions
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VDD
supply voltage
3.0
3.3
3.6
V
VI
input voltage
CMOS inputs
−0.3
-
VDD +0.3
V
HPD, DDC/AUX inputs [1][2]
−0.3
-
VDD +0.3
V
other inputs
−0.3
-
+2.6
V
Tamb
ambient temperature
operating in free air
−40
-
+85
°C



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