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TLE4976-2K Fiches technique(PDF) 7 Page - Infineon Technologies AG |
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TLE4976-2K Fiches technique(HTML) 7 Page - Infineon Technologies AG |
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7 / 16 page ![]() Data Sheet 5 Rev. 1.2, 2010-08-05 TLE4976-2K Functional Description 2.4 Block Diagram Figure 2 Functional Block Diagram 2.5 Functional Block Description The chopped Hall IC Switch comprises a Hall probe, bias generator, compensation circuits, oscillator and output transistor. The bias generator provides currents for the Hall probe and the active circuits. Compensation circuits stabilize the temperature behavior and reduce technology variations. The Active Error Compensation rejects offsets in signal stages and the influence of mechanical stress to the Hall probe caused by molding and soldering processes and other thermal stresses in the package. This chopper technique together with the threshold generator and the comparator ensure high accurate magnetic switching points. The current consumption depends on the switching status. Ref Chopped Hall Probe VS Amplifier Low Pass Filter Comparator with Hysteresis Voltage Regulator reverse polarity protected Oscillator and Sequencer Bias and Compensation Circuits 8 mA |
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