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LA112B-SEF.VG-R1-PF Fiches technique(PDF) 7 Page - LIGITEK electronics co., ltd.

No de pièce LA112B-SEF.VG-R1-PF
Description  LED ARRAY
PDF  7 Pages
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Fabricant  LIGITEK [LIGITEK electronics co., ltd.]
Site Internet  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LA112B-SEF.VG-R1-PF Fiches technique(HTML) 7 Page - LIGITEK electronics co., ltd.

  LA112B-SEF.VG-R1-PF Datasheet HTML 1Page - LIGITEK electronics co., ltd. LA112B-SEF.VG-R1-PF Datasheet HTML 2Page - LIGITEK electronics co., ltd. LA112B-SEF.VG-R1-PF Datasheet HTML 3Page - LIGITEK electronics co., ltd. LA112B-SEF.VG-R1-PF Datasheet HTML 4Page - LIGITEK electronics co., ltd. LA112B-SEF.VG-R1-PF Datasheet HTML 5Page - LIGITEK electronics co., ltd. LA112B-SEF.VG-R1-PF Datasheet HTML 6Page - LIGITEK electronics co., ltd. LA112B-SEF.VG-R1-PF Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
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The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
Solder Resistance
Test
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
Solderability Test
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
This test intended to see soldering well
performed or not.
Thermal Shock Test
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
High Temperature
High Humidity Test
1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202:103B
JIS C 7021: B-11
The purpose of this test is the resistance
of the device under tropical for hours.
High Temperature
Storage Test
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Low Temperature
Storage Test
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
MIL-STD-883:1008
JIS C 7021: B-10
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
JIS C 7021: B-12
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
Reliability Test:
Test Item
Test Condition
Reference
Standard
Description
Page 6/6
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LA112B/SEF.VG-R1-PF



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