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LA45B-2I-R1-PF Fiches technique(PDF) 6 Page - LIGITEK electronics co., ltd.

No de pièce LA45B-2I-R1-PF
Description  LED ARRAY
PDF  6 Pages
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Fabricant  LIGITEK [LIGITEK electronics co., ltd.]
Site Internet  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LA45B-2I-R1-PF Fiches technique(HTML) 6 Page - LIGITEK electronics co., ltd.

  LA45B-2I-R1-PF Datasheet HTML 1Page - LIGITEK electronics co., ltd. LA45B-2I-R1-PF Datasheet HTML 2Page - LIGITEK electronics co., ltd. LA45B-2I-R1-PF Datasheet HTML 3Page - LIGITEK electronics co., ltd. LA45B-2I-R1-PF Datasheet HTML 4Page - LIGITEK electronics co., ltd. LA45B-2I-R1-PF Datasheet HTML 5Page - LIGITEK electronics co., ltd. LA45B-2I-R1-PF Datasheet HTML 6Page - LIGITEK electronics co., ltd.  
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LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
MIL-STD-883:1008
JIS C 7021: B-10
Reference
Standard
JIS C 7021: B-12
MIL-STD-202:103B
JIS C 7021: B-11
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
Description
Test Condition
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
Test Item
Operating Life Test
High Temperature
Storage Test
Reliability Test:
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this test is the resistance
of the device under tropical for hours.
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
1.Ta=65
℃±5℃
2.RH=90%~95%
3.t=240hrs
±2hrs
Low Temperature
Storage Test
High Temperature
High Humidity Test
Thermal Shock Test
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
This test intended to see soldering well
performed or not.
Solderability Test
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
Solder Resistance
Test
Page 5/5
PART NO. LA45B/2I-R1-PF



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