PCIMX515CJM6C datasheet(60/184 Pages) FREESCALE

60 / 184 page

i.MX51 Applications Processors for Consumer and Industrial Products, Rev. 1

Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

Figure 34. DDR2 SDRAM DQ vs. DQS and SDCLK READ Cycle

3.7

External Peripheral Interfaces

3.7.1

CSPI Timing Parameters

This section describes the timing parameters of the CSPI. The CSPI has separate timing parameters for

master and slave modes. The nomenclature used with the CSPI modules and the respective routing of these

signals is shown in Table 51 on page 61.

Table 50. DDR2 SDRAM Read Cycle1

1 Test conditions are: Capacitance of 15 pF for DDR contacts. The recommended drive strength is Medium for SDCLK and High

for address and controls

Parameter

Symbol

SDCLK = 200 MHz2

2 SDCLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal value

and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and

SDCLK_B.

Unit

Min

Max

DDR24

DQS - DQ Skew (defines the Data valid window in read cycles related to

DQS).

tDQSQ

—0.35

DDR25

DQS DQ in HOLD time from DQS

tQH

1.8

—

DDR26

DQS output access time from SDCLK posedge

tDQSCK

–0.5

0.5

SDCLK

SDCLK_B

DQS (input)

DQ (input)

DATA

DDR26

DDR24

DDR25

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