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ADIS16265/PCBZ Fiches technique(PDF) 4 Page - Analog Devices

No de pièce ADIS16265/PCBZ
Description  Programmable Low Power Gyroscope
PDF  19 Pages
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Fabricant  AD [Analog Devices]
Site Internet  http://www.analog.com
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ADIS16265/PCBZ Fiches technique(HTML) 4 Page - Analog Devices

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ADIS16260/ADIS16265
Preliminary Technical Data
Rev. PrB | Page 4 of 19
Parameter
Conditions
Min
Typ
Max
Unit
DAC OUTPUT
5 kΩ/100 pF to GND
Resolution
12
Bits
Relative Accuracy
For Code 101 to Code 4095
4
LSB
Differential Nonlinearity
1
LSB
Offset Error
±5
mV
Gain Error
±0.5
%
Output Range
0 to 2.5
V
Output Impedance
2
Ω
Output Settling Time
10
μs
LOGIC INPUTS
Internal 3.3 V Interface
Input High Voltage, VINH
2.0
V
Input Low Voltage, VINL
0.8
V
For CS signal when used to wake up from sleep mode
0.55
V
Logic 1 Input Current, IINH
VIH = 3.3 V
±0.2
±10
μA
Logic 0 Input Current, IINL
VIL = 0 V
All except RST
−40
−60
μA
RST3
−1
mA
Input Capacitance, CIN
10
pF
DIGITAL OUTPUTS
Internal 3.3 V Interface
Output High Voltage, VOH
ISOURCE = 1.6 mA
2.4
V
Output Low Voltage, VOL
ISINK = 1.6 mA
0.4
V
SLEEP TIMER
Timeout Period4
0.5
128
sec
START-UP TIME
Initial
160
ms
Sleep Mode Recovery
2.5
ms
FLASH MEMORY
Endurance5
10,000
Cycles
Data Retention6
TJ = 55°C
20
Years
CONVERSION RATE
Minimum Conversion Time
0.488
ms
Maximum Conversion Time
7.75
sec
Maximum Throughput Rate
2048
SPS
Minimum Throughput Rate
0.129
SPS
POWER SUPPLY
Operating Voltage Range, VCC
4.75
5.0
5.25
V
Power Supply Current
Normal mode at 25°C
TBD
mA
Fast mode at 25°C
TBD
mA
Sleep mode at 25°C
TBD
μA
1 ADIS16265 characterization data represents ±4σ to fall within the ±1% limit.
2 The sensor is capable of ±600°/sec, but the specifications herein are for ±320°/sec only.
3 The RST pin has an internal pull-up.
4 Guaranteed by design.
5 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
6 Retention lifetime equivalent at junction temperature (TJ) 55°C, as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.



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