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RH1028M Fiches technique(PDF) 2 Page - Linear Technology |
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RH1028M Fiches technique(HTML) 2 Page - Linear Technology |
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2 / 2 page ![]() DICE/DWF SPECIFICATION 2 RH1028M/RH1128M Linear Technology Corporation 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2008 LT 0908 • PRINTED IN USA Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. I.D.No. 66-13-1028 DICE/DWF ELECTRICAL TEST LIMITS VS = ±15V, TA = 25°C, VCM = 0V, unless otherwise noted. Note 1: Input offset voltage measurements are performed by automatic test equipment approximately 0.5 seconds after application of power. SYMBOL PARAMETER CONDITIONS MIN MAX UNITS SR Slew Rate AVCL = –1 (RH1028) AVCL = –1 (RH1128) 11 4.5 V/μs V/μs IS Supply Current 10.5 mA |
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