![]() |
Moteur de recherche de fiches techniques de composants électroniques |
|
RH07 Fiches technique(PDF) 3 Page - Linear Technology |
|
|
RH07 Fiches technique(HTML) 3 Page - Linear Technology |
3 / 4 page ![]() 3 RH07 ELECTRICAL CHARACTERISTICS TABLE 1A: (Post-Irradiation) (Note 6) SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS VOS Input Offset Voltage 1 90 150 200 250 300 µV IOS Input Offset Current 2.8 4 8 12 20 nA IB Input Bias Current ±3 ±10 ±25 ±50 ±100 nA Input Voltage Range 3 ±13.5 ±13.5 ±13.5 ±13.5 ±13.5 V CMRR Common-Mode VCM = ±13V 110 110 105 100 95 dB Rejection Ratio PSRR Power Supply VS = ±3V to ±18V 100 100 100 95 90 dB Rejection Ratio AVOL Large-Signal Voltage Gain RL ≥ 2k, VO = ±10V 200 200 180 150 120 V/mV VOUT Maximum Output RL ≥ 10k ±12.5 ±12.5 ±12.5 ±12.5 ±12.5 V Voltage Swing SR Slew Rate RL ≥ 2k 0.1 0.1 0.1 0.075 0.05 V/ µs PD Power Dissipation 120 120 120 120 120 mW 10KRAD(Si) 20KRAD(Si) 50KRAD(Si) 100KRAD(Si) 200KRAD(Si) Note 1: Offset voltage is measured with high speed test equipment approximately 0.5 seconds after power is applied. Note 2: Long-term input offset voltage stability refers to the averaged trend line of VOS vs. time over extended periods after the first 30 days of operation. Excluding the initial hour of operation, changes in VOS during the first 30 days are typically 2.5 µV. Note 3: Parameter is guaranteed by design, characterization, or correlation to other tested parameters. Note 4: 10Hz noise voltage density is sample tested on every lot to an LTPD of 15. Devices 100% tested at 10Hz are available on request. Note 5: VS = ±15V, VCM = 0V, unless otherwise noted. Note 6: TA = 25°C, VS = ±15V, VCM = 0V, unless otherwise noted. TOTAL DOSE BIAS CURRE T – + 8V –15V 15V 10k RH07 F01 10k MIL-STD-883 TEST REQUIREMENTS SUBGROUP Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 Group A Test Requirements (Method 5005) 1,2,3,4,5,6 Group B and D for Class S, and 1 Group C and D for Class B End Point Electrical Parameters (Method 5005) * PDA Applies to subgroup 1. See PDA Test Notes. TABLE 2: ELECTRICAL TEST REQUIRE E TS PDA Test Notes The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, after burn-in divided by the total number of devices submitted for burn- in in that lot shall be used to determine the percent for the lot. Linear Technology Corporation reserves the right to test to tighter limits than those given. |
Numéro de pièce similaire - RH07 |
|
Description similaire - RH07 |
|
|
Lien URL |
Politique de confidentialité |
ALLDATASHEET.FR |
ALLDATASHEET vous a-t-il été utile ? [ DONATE ] |
À propos de Alldatasheet | Publicité | Contactez-nous | Politique de confidentialité | Echange de liens | Fabricants All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |