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RH07 Fiches technique(PDF) 3 Page - Linear Technology

No de pièce RH07
Description  Operational Amplifier
Download  4 Pages
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Fabricant  LINER [Linear Technology]
Site Internet  http://www.linear.com
Logo LINER - Linear Technology

RH07 Fiches technique(HTML) 3 Page - Linear Technology

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3
RH07
ELECTRICAL CHARACTERISTICS
TABLE 1A:
(Post-Irradiation) (Note 6)
SYMBOL PARAMETER
CONDITIONS
NOTES MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
UNITS
VOS
Input Offset Voltage
1
90
150
200
250
300
µV
IOS
Input Offset Current
2.8
4
8
12
20
nA
IB
Input Bias Current
±3
±10
±25
±50
±100
nA
Input Voltage Range
3
±13.5
±13.5
±13.5
±13.5
±13.5
V
CMRR
Common-Mode
VCM = ±13V
110
110
105
100
95
dB
Rejection Ratio
PSRR
Power Supply
VS = ±3V to ±18V
100
100
100
95
90
dB
Rejection Ratio
AVOL
Large-Signal Voltage Gain
RL ≥ 2k, VO = ±10V
200
200
180
150
120
V/mV
VOUT
Maximum Output
RL ≥ 10k
±12.5
±12.5
±12.5
±12.5
±12.5
V
Voltage Swing
SR
Slew Rate
RL ≥ 2k
0.1
0.1
0.1
0.075
0.05
V/
µs
PD
Power Dissipation
120
120
120
120
120
mW
10KRAD(Si)
20KRAD(Si)
50KRAD(Si) 100KRAD(Si) 200KRAD(Si)
Note 1: Offset voltage is measured with high speed test equipment
approximately 0.5 seconds after power is applied.
Note 2: Long-term input offset voltage stability refers to the averaged
trend line of VOS vs. time over extended periods after the first 30 days of
operation. Excluding the initial hour of operation, changes in VOS during
the first 30 days are typically 2.5
µV.
Note 3: Parameter is guaranteed by design, characterization, or correlation
to other tested parameters.
Note 4: 10Hz noise voltage density is sample tested on every lot to an
LTPD of 15. Devices 100% tested at 10Hz are available on request.
Note 5: VS = ±15V, VCM = 0V, unless otherwise noted.
Note 6: TA = 25°C, VS = ±15V, VCM = 0V, unless otherwise noted.
TOTAL DOSE BIAS CURRE T
+
8V
–15V
15V
10k
RH07 F01
10k
MIL-STD-883 TEST REQUIREMENTS
SUBGROUP
Final Electrical Test Requirements (Method 5004)
1*,2,3,4,5,6
Group A Test Requirements (Method 5005)
1,2,3,4,5,6
Group B and D for Class S, and
1
Group C and D for Class B
End Point Electrical Parameters (Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
TABLE 2: ELECTRICAL TEST REQUIRE E TS
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup
1, after burn-in divided by the total number of devices submitted for burn-
in in that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.


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