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ADATE209BBCZ Fiches technique(PDF) 6 Page - Analog Devices

No de pièce ADATE209BBCZ
Description  4.0 Gbps Dual Driver
PDF  16 Pages
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Fabricant  AD [Analog Devices]
Site Internet  http://www.analog.com
Logo AD - Analog Devices

ADATE209BBCZ Fiches technique(HTML) 6 Page - Analog Devices

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ADATE209
Rev. 0 | Page 6 of 16
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Rating
Supply Voltages
Positive Supply Voltage (VCC to GND)
−0.5 V to +8.0 V
Negative Supply Voltage (VEE to GND)
−5.0 V to +0.5 V
Supply Voltage Difference (VCC to VEE)
−1.0 V to +13 V
Reference Ground (DUTGND to GND)
−0.5 V to +0.5 V
Input Voltages
Input Common-Mode Voltage
VEE to VCC
Short-Circuit Voltage (RL = 0 Ω, VDUT
Continuous Short-Circuit Condition)
−1.5 V to +4.0 V
High Speed Input Voltage
(Data and Termination Inputs, DAx, DBx,
and TERMx)
−1.5 V to +3.9 V
High Speed Differential Input Voltage
(DAx, DBx, TERMx to Termination Pin
DAxT, DBxT, TERMxT)
2 V
VHx, VLx, VTx
−2 V to +4.5 V
CLCxEN
−1 V to +3.5 V
DROUTx I/O Pin Current
DCL Maximum Short-Circuit Current
(RL = 0 Ω, VDUT = −1.5 V to +4 V; DCL
Current Limit)
±100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θJA is specified for the following conditions: JEDEC 4L PCB,
50°C, and 100 LFM forced convection. θJC is specified for a 50°C
cold plate and 50°C ambient temperature.
Table 3. Thermal Resistance
Package Type
θJA
θJC
Unit
49-Ball CSP_BGA
48.4
3.9
°C/W
EXPLANATION OF TEST LEVELS
I.
Definition.
II.
100% Production Tested.
III.
Characterized on Tester.
IV.
Functionally Checked During Production Test.
V.
Characterized on Bench.
ESD CAUTION



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