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CSD87331Q3D Fiches technique(PDF) 4 Page - Texas Instruments |
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CSD87331Q3D Fiches technique(HTML) 4 Page - Texas Instruments |
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4 / 27 page ![]() HD HG LG LD M0205-01 LS HS HD HG LG LD M0206-01 LS HS 4 CSD87331Q3D SLPS283B – SEPTEMBER 2011 – REVISED FEBRUARY 2017 www.ti.com Product Folder Links: CSD87331Q3D Submit Documentation Feedback Copyright © 2011–2017, Texas Instruments Incorporated 5.5 Electrical Characteristics TA = 25°C (unless otherwise stated) PARAMETER TEST CONDITIONS Q1 Control FET Q2 Sync FET MIN TYP MAX MIN TYP MAX UNIT STATIC CHARACTERISTICS BVDSS Drain-to-source voltage VGS = 0 V, IDS = 250 µA 30 30 V IDSS Drain-to-source leakage current VGS = 0 V, VDS = 20 V 1 1 µA IGSS Gate-to-source leakage current VDS = 0 V, VGS = +10 / –8 V 100 100 nA VGS(th) Gate-to-source threshold voltage VDS = VGS, IDS = 250 µA 1 2.1 0.8 1.2 V ZDS(on) Effective AC on-impedance VIN = 12 V, VGS = 5 V, VOUT = 1.3 V, IOUT = 10 A, ƒSW = 500 kHz, LOUT = 1 µH 18 5.5 m Ω gfs Transconductance VDS = 15 V, IDS = 8A 26 48 S DYNAMIC CHARACTERISTICS CISS Input capacitance VGS = 0 V, VDS = 15 V, ƒ = 1 MHz 432 518 926 1110 pF COSS Output capacitance 158 190 378 454 pF CRSS Reverse transfer capacitance 7 9 24 30 pF RG Series gate resistance 5.2 6.5 0.7 1.5 Ω Qg Gate charge total (4.5 V) VDS = 15 V, IDS = 8 A 2.7 3.2 6.4 7.7 nC Qgd Gate charge gate-to-drain 0.4 1.1 nC Qgs Gate charge gate-to-source 0.9 1.5 nC Qg(th) Gate charge at Vth 0.5 0.8 nC QOSS Output charge VDS = 14 V, VGS = 0 V 3.6 7.7 nC td(on) Turnon delay time VDS = 15 V, VGS = 4.5 V, IDS = 8 A, RG = 2 Ω 3.4 3.8 ns tr Rise time 4.5 4.7 ns td(off) Turnoff delay time 7.4 11.2 ns tf Fall time 1.3 2.4 ns DIODE CHARACTERISTICS VSD Diode forward voltage IDS = 8 A, VGS = 0 V 0.85 1 0.85 1 V Qrr Reverse recovery charge VDS = 14 V, IF = 8 A, di/dt = 300 A/µs 4 5.9 nC trr Reverse recovery time 10 13 ns Max RθJA = 80°C/W when mounted on 1 in2 (6.45 cm2) of 2-oz (0.071-mm) thick Cu. Max RθJA = 149°C/W when mounted on minimum pad area of 2-oz (0.071-mm) thick Cu. |
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