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CLP200M Fiches technique(PDF) 12 Page - STMicroelectronics |
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CLP200M Fiches technique(HTML) 12 Page - STMicroelectronics |
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12 / 21 page ![]() Fig. 26 : Induction test behavior (Test 3b). Fig. 28 : Power contact test 3 (with R ≤ 10 Ω series). Fig. 27 : Power contact test. 4Ω TIPL TIPS GND 1/2 CLP200M I V V(RMS) 50Hz 600 or < 10 15min PTC Rsense Rp I2 SLIC LCP1511D -48V V2 3.3.3 - Power contact test (Test 3 table 1/K20) The test 3 of CCITT K20 requires a serial PTC (or fuse) which is inserted in the test circuit to limit the current rate. This PTC acts like an open-circuit af- ter 60 ms when a surge occurs on the line. Mean- while, the CLP200M has to withstand the surge. The protection device CLP200M totally fulfills this test. ® CLP200M 12/21 |
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