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AM29F016D Fiches technique(PDF) 29 Page - Advanced Micro Devices |
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AM29F016D Fiches technique(HTML) 29 Page - Advanced Micro Devices |
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29 / 43 page ![]() November 1, 2006 21444E6 Am29F016D 27 D A TA SH EE T AC CHARACTERISTICS Read-only Operations Notes: 1. Not 100% tested. 2. Refer to and for test specifications. Parameter Symbol Parameter Description Test Setup Speed Options Unit JEDEC Std -70 -90 -120 tAVAV tRC Read Cycle Time (Note 1) Min 70 90 120 ns tAVQV tACC Address to Output Delay CE# = VIL OE# = VIL Max 70 90 120 ns tELQV tCE Chip Enable to Output Delay OE# = VIL Max 70 90 120 ns tGLQV tOE Output Enable to Output Delay Max 40 40 50 ns tOEH Output Enable Hold Time (Note 1) Read Min 0 0 0 ns Toggle and Data# Polling Min 10 10 10 ns tEHQZ tDF Chip Enable to Output High Z (Note 1) Max 20 20 30 ns tGHQZ tDF Output Enable to Output High Z (Note 1) Max 20 20 30 ns tAXQX tOH Output Hold Time From Addresses CE# or OE# Whichever Occurs First Min 0 0 0 ns tReady RESET# Pin Low to Read Mode (Note 1) Max 20 20 20 µs tCE Outputs WE# Addresses CE# OE# HIGH Z Output Valid HIGH Z Addresses Stable tRC tACC tOEH tOE 0 V RY/BY# RESET# tDF tOH Figure 9. Read Operation Timings |
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