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STTH812 Fiches technique(PDF) 3 Page - STMicroelectronics

No de pièce STTH812
Description  Ultrafast recovery - 1200 V diode
PDF  11 Pages
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Fabricant  STMICROELECTRONICS [STMicroelectronics]
Site Internet  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STTH812 Fiches technique(HTML) 3 Page - STMicroelectronics

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STTH812
Characteristics
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Table 4.
Dynamic characteristics
Symbol
Parameter
Test conditions
Min.
Typ
Max.
Unit
trr
Reverse recovery time
IF = 1 A, dIF/dt = -50 A/µs,
VR = 30 V, Tj = 25° C
100
ns
IF = 1 A, dIF/dt = -100 A/µs,
VR = 30 V, Tj = 25° C
50
70
IRM
Reverse recovery current
IF = 8 A, dIF/dt = -200 A/µs,
VR = 600 V, Tj = 125° C
14
21
A
S
Softness factor
IF = 8 A, dIF/dt = -200 A/µs,
VR = 600 V, Tj = 125° C
2
tfr
Forward recovery time
IF = 8 A
dIF/dt = 50 A/µs
VFR = 1.5 x VFmax, Tj = 25° C
400
ns
VFP
Forward recovery voltage
IF = 8 A, dIF/dt = 50 A/µs,
Tj = 25° C
7V
Figure 1.
Conduction losses versus
average current
Figure 2.
Forward voltage drop versus
forward current
0
2
4
6
8
10
12
14
16
18
20
01
2
3
456
7
8
9
10
P(W)
T
δ=tp/T
tp
δ = 0.05
δ = 1
I
(A)
F(AV)
δ = 0.1
δ = 0.2
δ = 0.5
0
10
20
30
40
50
60
70
80
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
I
(A)
FM
V
(V)
FM
T =25°C
(maximum values)
j
T =150°C
(maximum values)
j
T =150°C
(typical values)
j
Figure 3.
Relative variation of thermal
impedance junction to case
versus pulse duration
Figure 4.
Relative variation of thermal
impedance junction to case versus
pulse duration
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.E-03
1.E-02
1.E-01
1.E+00
Z/R
th(j-c)
th(j-c)
t (s)
p
Single pulse
TO-220AC
DPAK
TO-220Ins
2
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.E-03
1.E-02
1.E-01
1.E+00
1.E+01
Z/R
th(j-c)
th(j-c)
t (s)
p
Single pulse
TO-220FPAC



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