ISL70227SEH

FN7958 Rev 3.00

Page 8 of 18

July 18, 2014

Low Dose Rate Post Radiation Characteristics V

S ±15V, VCM = 0V, VO = 0V, RL = Open, TA = +25°C, unless otherwise noted.

This data is typical test data post radiation exposure at a rate of 10mrad(Si)/s. This data is intended to show typical parameter shifts due to low dose

rate radiation. These are not limits nor are they guaranteed .

FIGURE 3. OFFSET VOLTAGE vs RADIATION

FIGURE 4. POSITIVE INPUT BIAS CURRENT vs RADIATION

FIGURE 5. NEGATIVE INPUT BIAS CURRENT vs RADIATION

FIGURE 6. OFFSET CURRENT vs RADIATION

FIGURE 7. TOTAL SUPPLY CURRENT vs RADIATION

TOTAL DOSE (krad(Si))

0

5

10

15

20

25

0

10

2030

4050

60708090

100

GROUNDED

BIASED

TOTAL DOSE (krad(Si))

-25

-20

-15

-10

-5

0

5

0

102030

4050

60708090

100

GROUNDED

BIASED

TOTAL DOSE (krad(Si))

-25

-20

-15

-10

-5

0

0

10

2030

4050607080

90

100

GROUNDED

BIASED

TOTAL DOSE (krad(Si))

-25

-20

-15

-10

-5

0

0

10

2030

4050

60

708090

100

GROUNDED

BIASED

TOTAL DOSE (krad(Si))

0

5

10

0

102030

4050

607080

90

100

GROUNDED

BIASED