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74ALS20AD Fiches technique(PDF) 4 Page - NXP Semiconductors |
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74ALS20AD Fiches technique(HTML) 4 Page - NXP Semiconductors |
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4 / 7 page ![]() Philips Semiconductors Product specification 74ALS20A Dual 4-input NAND gate 1996 Jul 01 4 AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITION Tamb = 0°C to +70°C VCC = +5.0V ± 10% CL = 50pF, RL = 500Ω UNIT MIN MAX tPLH tPHL Propagation delay nA, nB, nC, nD to nY Waveform 1 2.0 3.0 11.0 10.0 ns AC WAVEFORMS For all waveforms, VM = 1.3V. VM VM VM VM tPLH tPHL nA, nB, nC, nD nY SC00027 Waveform 1. Propagation Delay for Data to Output TEST CIRCUIT AND WAVEFORMS tw 90% VM 10% 90% VM 10% 90% VM 10% 90% VM 10% NEGATIVE PULSE POSITIVE PULSE tw AMP (V) 0.3V 0.3V tTHL (tff) INPUT PULSE REQUIREMENTS Rep.Rate tw tTLH tTHL 1MHz 500ns 2.0ns 2.0ns Input Pulse Definition VCC Family 74ALS D.U.T. PULSE GENERATOR RL CL RT VIN VOUT Test Circuit for Totem-pole Outputs DEFINITIONS: RL = Load resistor; see AC electrical characteristics for value. CL = Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value. RT = Termination resistance should be equal to ZOUT of pulse generators. tTHL (tf ) tTLH (tr ) tTLH (tr ) AMP (V) Amplitude 3.5V 1.3V VM SC00005 |
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