021 ASM

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Vishay BCcomponents

Revision: 16-Sep-16

8

Document Number: 28325

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Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the

lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.

TEST PROCEDURES AND REQUIREMENTS

TEST

PROCEDURE

(quick reference)

REQUIREMENTS

NAME OF TEST

REFERENCE

Endurance

IEC 60384-4 /



EN130300



subclause 4.13

Tamb = 85 °C; UR applied;

case Ø D x L = 4.5 mm x 10 mm to



10 mm x 25 mm:



UR = 6.3 V to 25 V: 1000 h;

UR = 40 V to 100 V: 2000 h;

case Ø D x L = 10 mm x 30 m to



21 mm x 38 mm:



UR = 6.3 V to 100 V: 5000 h

UR 6.3 V; C/C: +15 % / -30 %

UR > 6.3 V; C/C: ± 15 %

tan

 1.3 x spec. limit

Z

2 x spec. limit

IL5  spec. limit

Tamb = 105 °C; UR applied;

case Ø D x L = 10 mm x 30 mm to



21 mm x 38 mm: 2000 h

C/C:  ± 20 %

tan

 1.6 x spec. limit

Z

 2x spec. limit

IL5  spec. limit

Useful life

CECC 30301



subclause 1.8.1

Tamb = 85 °C; UR and IR applied;

case Ø D x L = 4.5 mm x 10 mm to



10 mm x 25 mm: 2500 h;



case Ø D x L = 10 mm x 30 mm to



21 mm x 38 mm: 8000 h

UR  6.3 V; C/C: +45 % / -50 %

UR > 6.3 V;C/C: ± 45 %

tan

  3 x spec. limit

Z

 3 x spec. limit

IL5  spec. limit

no short or open circuit

total failure percentage:

 1 %

Shelf life



(storage at



high temperature)

IEC 60384-4 /



EN130300



subclause 4.17

Tamb = 85 °C; no voltage applied;

500 h

After test: UR to be applied for 30 min,

24 h to 48 h before measurement

C/C, tan , Z: 

for requirements



see “Endurance test” above

IL5  2 x spec. limit