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TLE4971 Fiches technique(PDF) 4 Page - Infineon Technologies AG

No de pièce TLE4971
Description  TLE4971 high precision coreless current sensor for automotive applications in 8x8mm SMD package
PDF  23 Pages
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Fabricant  INFINEON [Infineon Technologies AG]
Site Internet  http://www.infineon.com
Logo INFINEON - Infineon Technologies AG

TLE4971 Fiches technique(HTML) 4 Page - Infineon Technologies AG

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Datasheet
4
Revision 1.02
19-08-2022
TLE4971
Datasheet
Absolute Maximum Ratings
Table 2 Absolute Maximum Ratings
General conditions (unless otherwise specified): VDD = 3.3V; TS = -40°C … +125°C
Parameter
Symbol
Min
Typ
Max
Unit
Note /
Test Condition
Supply voltage
VDD
-0.3
3.3
3.6
V
-
-
6.5
V
duration < 1 minute
Primary nominal rated
current LF1)
IPNRLF
-70
-
70
A
Peak, frequency < 10Hz.
Tested on Infinenon reference
PCB (see related application
note: AppNote TLx4971 PCB)
Primary nominal rated
current HF2)
IPNRHF
-70
-
70
A
RMS, frequency ≥ 10Hz.
Tested on Infinenon reference
PCB (see related application
note: AppNote TLx4971 PCB)
Primary current
IPNS
-250
-
250
A
Single peak for 10µs,
10 assertions per lifetime
Voltage on interface pins
VREF, OCD1, AOUT
VIO
-0.3
-
VDD + 0.3
V
Voltage on Interface pin
OCD2
VIO_OCD2
-0.3
-
21
V
ESD voltage3)
VESD_HBM
-2
-
2
kV
ESD voltage4)
VESD_SYS
-16
-
16
kV
In the application circuit
Voltage slew-rate on
current rail
ΔV/dt
-
-
10
V/ns
Maximum junction
temperature
Tj_max
-
-
130
°C
Storage temperature
TA_STORE
-40
-
150
°C
Life time
LT
15
-
-
Years
Considering continuous
operation with TS = 70°C
and I = 30 A RMS
1)
Tested with primary nominal rated current of 70A peak on Infineon reference PCB at Low Frequency (LF).
Thermal equilibrium reached after 2 min.
2)
Tested with primary nominal rated current of 70A rms on Infineon reference PCB at High Frequency (HF).
Thermal equilibrium reached after 2 min.
3)
Human Body Model (HBM), according to standard AEC-Q 100-002
4)
According to standard IEC 61000−4−2 electrostatic discharge immunity test
Stress above the limit values listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability. Maximum ratings are absolute
ratings. Exceeding only one of these values may cause irreversible damage to the integrated circuit.



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