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STP50N65DM6 Fiches technique(PDF) 4 Page - STMicroelectronics |
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STP50N65DM6 Fiches technique(HTML) 4 Page - STMicroelectronics |
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4 / 11 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 33 A ISDM (1) Source-drain current (pulsed) - 120 A VSD (2) Forward on voltage VGS = 0 V, ISD = 33 A - 1.6 V trr Reverse recovery time ISD = 33 A, di/dt = 100 A/µs,VDD = 60 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 130 ns Qrr Reverse recovery charge - 0.65 µC IRRM Reverse recovery current - 10 A trr Reverse recovery time ISD = 33 A, di/dt = 100 A/µs VDD = 60 V, Tj = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 226 ns Qrr Reverse recovery charge - 2.32 µC IRRM Reverse recovery current - 20.6 A 1. Pulse width limited by safe operating area 2. Pulsed: pulse duration = 300 µs, duty cycle 1.5% STP50N65DM6 Electrical characteristics DS12360 - Rev 4 page 4/11 |
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