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PI5USB2546AQ Fiches technique(PDF) 5 Page - Diodes Incorporated |
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PI5USB2546AQ Fiches technique(HTML) 5 Page - Diodes Incorporated |
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5 / 30 page ![]() PI5USB2546AQ www.diodes.com July 2018 Document Number DS41253 Rev 1-2 5 © Diodes Incorporated PI5USB2546AQ Electrical Characteristics 4.5V≤V IN≤5.5V; TJ=-40°C to +125°C; VEN =VIN, VILIM_SEL=VIN, VCTL1= VCTL2= VCTL3=VIN, R/FAULT=R/STATUS=10kΩ, RILIM_HI=20kΩ, RILIM_LO=80.6kΩ, Positive currents are into pins. Typical values are at 25°C. All voltages are with respect to GND. unless otherwise specified. Symbol Description Test Conditions Min. Typ. Max. Unit ILIM_SEL Current Limit IOS OUT Current-limit (2) VILIM_SEL= 0 V RILIM_LO=210kΩ 205 240 275 mA VILIM_SEL= 0 V RILIM_LO=80.6kΩ 575 625 680 VILIM_SEL= 0 V RILIM_LO=22.1kΩ 2120 2275 2430 VILIM_SEL= VIN RILIM_HI=20kΩ 2340 2510 2685 VILIM_SEL= VIN RILIM_HI=16.9kΩ 2770 2970 3170 tIOS Response time to OUT short circuit (1) VIN = 5.0V, R=0.1Ω, lead length=2” - 1.5 - s Supply Current IIN_OFF Disabled IN supply current VEN=0V, VOUT=0V, TJ =-40°C to +125°C - 0.1 2 A IIN_ON Enable IN supply current VCTL1=VCTL2= VIN, VCTL3= 0V VILIM_SEL = 0V - 165 220 VCTL1 = VCTL2 = VCTL3 = VIN, VILIM_SEL = 0V - 175 230 VCTL1 = VCTL2 = VIN, VCTL3 = 0V, VILIM_SEL = VIN - 185 240 VCTL1 = VCTL2 = VCTL3 = VIN, VILIM_SEL = VIN - 195 250 VCTL1 = 0V, VCTL2 = VCTL3 = VIN, VILIM_SEL = 0V - 215 270 VCTL1 = 0V, VCTL2 = VCTL3 = VIN, VILIM_SEL = VIN - 240 290 Undervoltage Lockout VUVLO IN rising UVLO threshold voltage - 3.9 4.1 4.3 V Hysteresis (1) - - 100 - mV /FAULT VOL Output low voltage I/FAULT = 1mA - - 100 mV IOFF Off-state leakage current V/FAULT = 5.5V - - 1 A TD Over current /FAULT rising and falling deglitch - 5 8.2 12 ms /STATUS (PI5USB2546AQ) VOL Output low voltage I/STATUS = 1mA - - 100 mV IOFF Off-state leakage V/STATUS = 5.5V - - 1 A Thermal Shutdown OTSD Thermal shutdown threshold - 170 - °C Hysteresis (1) - - 20 - Note: (1) These parameters are provided for reference only and do not constitute part of Pericom's published device specifications for purposes of Pericom's product warranty (2) Pulse-testing techniques maintain junction temperature close to ambient temperature; current limit value tested at 80% output voltage. Thermal effects must be taken into account separately. |
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