IXFL40N110P

IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.

IXYS MOSFETs and IGBTs are covered

4,835,592

4,931,844

5,049,961

5,237,481

6,162,665

6,404,065 B1

6,683,344

6,727,585

7,005,734 B2

7,157,338B2

by one or more of the following U.S. patents: 4,860,072

5,017,508

5,063,307

5,381,025

6,259,123 B1

6,534,343

6,710,405 B2 6,759,692

7,063,975 B2

4,881,106

5,034,796

5,187,117

5,486,715

6,306,728 B1

6,583,505

6,710,463

6,771,478 B2 7,071,537

Symbol

Test Conditions

Characteristic Values

(T

Min.

Typ.

Max.

g

fs

V

20

32

S

C

iss

19

nF

C

oss

V

1070

pF

C

rss

46

pF

R

Gi

Gate Input Resistance

1.65



t

d(on)

53

ns

t

r

55

ns

t

d(off)

110

ns

t

f

54

ns

Q

g(on)

310

nC

Q

gs

V

95

nC

Q

gd

142

nC

R

thJC

0.35

C/W

R

thCS

0.15

C/W

Source-Drain Diode

Symbol

Test Conditions

Characteristic Values

(T

Min.

Typ.

Max.

I

S

V

40

A

I

SM

Repetitive, Pulse Width Limited by T

JM

160

A

V

SD

I

1.5

V

t

rr

300 ns

Q

RM

2.2

C

I

RM

16.0

A

Note

1. Pulse test, t

 300s, duty cycle, d  2%.

I

V

Resistive Switching Times

V

R