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ELM302X Fiches technique(PDF) 5 Page - Everlight Electronics Co., Ltd |
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ELM302X Fiches technique(HTML) 5 Page - Everlight Electronics Co., Ltd |
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5 / 11 page ![]() DATASHEET 4PIN SOP RANDOM-PHASE TRIAC PHOTO COUPLER ELM302X, ELM305X series 5 Copyright © 2010, Everlight All Rights Reserved. Release Date : JUNE 24, 2013. Issue No:DPC-0000083 Rev.3 www.everlight.com Figure 8. Static dv/dt Test Circuit & Waveform Measurement Method The high voltage pulse is set to the required VPEAK value and applied to the D.U.T. output side through the RC circuit above. LED current is not applied. The waveform VT is monitored using a x100 scope probe. By varying RTEST, the dv/dt (slope) is increased, until the D.U.T. is observed to trigger (waveform collapses). The dv/dt is then decreased until the D.U.T. stops triggering. At this point, τRC is recorded and the dv/dt calculated. For example, VPEAK = 400V for EL302X series. The dv/dt value is calculated as follows: VPEAK 0 Applied VT Waveform τRC 0.632 x VPEAK 50 10 k D.U.T. RTEST High Voltage Pulse Source CTEST VT A K T1 T2 0.63 x 400 τRC dv/dt = = 252 τRC 0.632 x VPEAK τRC dv/dt = |
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