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ICS85320AMILF Fiches technique(PDF) 4 Page - Integrated Device Technology

No de pièce ICS85320AMILF
Description  LVCMOS/LVTTL-to-Differential 3.3V, 2.5V LVPECL Translator
PDF  16 Pages
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Fabricant  IDT [Integrated Device Technology]
Site Internet  http://www.idt.com
Logo IDT - Integrated Device Technology

ICS85320AMILF Fiches technique(HTML) 4 Page - Integrated Device Technology

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LVCMOS/LVTTL-TO-DIFFERENTIAL
3.3V, 2.5V LVPECL TRANSLATOR
85320 DATA SHEET
4
REVISION B 12/19/14
TABLE 4B. AC CHARACTERISTICS, V
CC
= 2.5V±5%, TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
f
MAX
Output Frequency
215
MHz
t
PD
Propagation Delay; NOTE 1
ƒ ≤ 267MHz
0.8
1.7
ns
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
Integration Range:
12KHz - 20MHz
0.05
ps
tsk(pp)
Part-to-Part Skew; NOTE 2, 3
375
ps
t
R
, t
F
Output Rise/Fall Time
20% to 80%
200
700
ps
odc
Output Duty Cycle
45
55
%
NOTE 1: Measured from V
CC
/2 point of the input to the differential output crossing point.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load
conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
TABLE 4A. AC CHARACTERISTICS, V
CC
= 3.3V±5%, TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
f
MAX
Output Frequency
267
MHz
t
PD
Propagation Delay; NOTE 1
ƒ ≤ 267MHz
0.8
1.4
ns
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
Integration Range:
12KHz - 20MHz
0.05
ps
tsk(pp)
Part-to-Part Skew; NOTE 2, 3
275
ps
t
R
, t
F
Output Rise/Fall Time
20% to 80%
200
700
ps
odc
Output Duty Cycle
45
55
%
NOTE 1: Measured from V
CC
/2 point of the input to the differential output crossing point.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load
conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.



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