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ams Datasheet

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[v1-00] 2016-Aug-26

TSL2772 − Absolute Maximum R atings

Note(s):

1. Parameter is ensured by design or characterization and is not tested.

2. Proximity noise is defined as one standard deviation of 600 samples.

3. Proximity noise typically increases as √PPULSE

4. Greater operating distances are achievable with appropriate optical system design considerations. See available ams application

notes for additional information.

5. Maximum operating distance is dependent upon emitter and the reflective properties of the object’s surface.

6. Proximity noise test was done using Figure 10.

Figure 10:

Proximity Noise Test Circuit

Figure 11:

Wait Characteristics, VDD = 3 V, TA = 25°C, WEN = 1 (unless otherwise noted)

Note(s):

1. Parameter ensured by design and is not tested.

Maximum

operating distance

(1)(4)(5)

PDRIVE = 0 and PDL = 0 (116 mA), PPULSE = 64

inches

Emitter:

λp = 850 nm, 20º half angle, and

60 mW/sr

Object: 16

× 20-inch, 90% reflective Kodak Gray

Card (white surface)

Optics: Open view (no glass, no optical

attenuation)

Parameter

Test

Conditions

Channel

Min

Typ

Max

Unit

Wait step size

WTIME = 0xFF

2.58

2.73

2.9

Wait number of integration steps (1)

1256

steps

Parameter

Test Conditions

Min

Typ

Max

Unit

TSL2772

VDD

15.0

VDD

GND

LDR

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