Data Sheet

30

Rev. 1.0

2016-08-05

TLE8457

LIN Transceiver with integrated Voltage Regulator

Application Information

7.2

ESD Robustness according to IEC61000-4-2

Test for ESD robustness according to IEC61000-4-2 (150 pF, 330 Ω) have been performed. The results and test

conditions are available in a separate test report.

7.3

Transient Robustness according to ISO 7637-2

Test for transient robustness according to ISO 7637-2 have been performed. The results and test conditions

are available in a separate test report.

7.4

LIN Physical Layer Compatibility

As the LIN physical layer is independent from higher LIN layers (for example LIN protocol layer), all nodes with

a LIN physical layer according to this revision can be mixed with LIN physical layer nodes, which are according

to older revisions (LIN 1.0, LIN 1.1, LIN 1.2, LIN 1.3, LIN 2.0, LIN 2.1 and LIN 2.2), without any restrictions.

Table 7

ESD Robustness according to IEC61000-4-2

Performed Test

Results Unit

Remarks

+8

kV

1) ESD susceptibility according LIN EMC 1.3 Test Specification, Section 4.3. (IEC 61000-4-2) - Tested by external test

house.

-8

kV

1)Negative pulse

Table 8

Automotive Transient Robustness according to ISO 7637-2

Performed Test

Results

Unit

Pulse 1

-100

V

Pulse 2

+75

V

Pulse 3a

-150

V

Pulse 3b

+100

V