LP2950 datasheet(4/22 Pages) ONSEMI

4 / 22 page

LP2950, LP2951, NCV2951

www.onsemi.com

ELECTRICAL CHARACTERISTICS

(Vin = VO + 1.0 V, IO = 100 mA, CO = 1.0 mF, TA = 25°C [Note 3], unless otherwise noted.)

Characteristic

Symbol

Min

Typ

Max

Unit

Output Voltage, 5.0 V Versions

Vin = 6.0 V, IO = 100 mA, TA = 25°C

LP2950C−5.0/LP2951C/NCV2951C*

4.950

5.000

5.050

LP2950AC−5.0/LP2951AC/NCV2951AC*

4.975

5.000

5.025

TA = − 40 to +125°C

LP2950C−5.0/LP2951C/NCV2951C*

4.900

−

5.100

LP2950AC−5.0/LP2951AC/NCV2951AC*

4.940

−

5.060

Vin = 6.0 to 30 V, IO = 100 mA to 100 mA, TA = − 40 to +125°C

LP2950C−5.0/LP2951C/NCV2951C*

4.880

−

5.120

LP2950AC−5.0/LP2951AC/NCV2951AC*

4.925

−

5.075

Output Voltage, 3.3 V Versions

Vin = 4.3 V, IO = 100 mA, TA = 25°C

LP2950C−3.3/LP2951C−3.3

3.267

3.300

3.333

LP2950AC−3.3/LP2951AC−3.3/NCV2951AC−3.3*

3.284

3.300

3.317

TA = − 40 to +125°C

LP2950C−3.3/LP2951C−3.3

3.234

−

3.366

LP2950AC−3.3/LP2951AC−3.3/NCV2951AC−3.3*

3.260

−

3.340

Vin = 4.3 to 30 V, IO = 100 mA to 100 mA, TA = − 40 to +125°C

LP2950C−3.3/LP2951C−3.3

3.221

−

3.379

LP2950AC−3.3/LP2951AC−3.3/NCV2951AC−3.3*

3.254

−

3.346

Output Voltage, 3.0 V Versions

Vin = 4.0 V, IO = 100 mA, TA = 25°C

LP2950C−3.0/LP2951C−3.0

2.970

3.000

3.030

LP2950AC−3.0/LP2951AC−3.0

2.985

3.000

3.015

TA = − 40 to +125°C

LP2950C−3.0/LP2951C−3.0

2.940

−

3.060

LP2950AC−3.0/LP2951AC−3.0

2.964

−

3.036

Vin = 4.0 to 30 V, IO = 100 mA to 100 mA, TA = − 40 to +125°C

LP2950C−3.0/LP2951C−3.0

2.928

−

3.072

LP2950AC−3.0/LP2951AC−3.0

2.958

−

3.042

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product

performance may not be indicated by the Electrical Characteristics if operated under different conditions.

1. The Junction−to−Ambient Thermal Resistance is determined by PCB copper area per Figure 29.

2. This device series contains ESD protection and exceeds the following tests:

Human Body Model (HBM), 2000 V, Class 2, JESD22 A114−C

Machine Model (MM), 200 V, Class B, JESD22 A115−A

Charged Device Model (CDM), 2000 V, Class IV, JESD22 C101−C

3. Low duty pulse techniques are used during test to maintain junction temperature as close to ambient as possible.

4. VO(nom) is the part number voltage option.

5. Noise tests on the LP2951 are made with a 0.01

mF capacitor connected across Pins 7 and 1.

*NCV prefix is for automotive and other applications requiring site and change control.

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