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IXTP01N100 Fiches technique(PDF) 2 Page - IXYS Corporation |
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IXTP01N100 Fiches technique(HTML) 2 Page - IXYS Corporation |
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2 / 2 page ![]() IXYS MOSFETS and IGBTs are covered by one or more of the following U.S. patents: 4,835,592 4,881,106 5,017,508 5,049,961 5,187,117 5,486,715 4,850,072 4,931,844 5,034,796 5,063,307 5,237,481 5,381,025 IXYS reserves the right to change limits, test conditions, and dimensions. IXTP 01N100D Symbol Test Conditions Characteristic Values (T J = 25°C, unless otherwise specified) min. typ. max. g fs V DS = 50 V; I D = ID25 Note 1 100 150 mS C iss 120 pF C oss V GS = -10 V, V DS = 25 V, f = 1 MHz 15 pF C rss 3pF t d(on) 8n s t r V gs = 0 V, to -10 V, I D = 50 mA 6 n s t d(off) V ds = 100 V 30 n s t f R G = 30 Ω, (External) 51 n s R thJC 5 K/W Source-Drain Diode Characteristic Values (T J = 25°C, unless otherwise specified) Symbol Test Conditions min. typ. max. V SD V GS = -10 V, IF = ID25 Note 1 1.0 1.5 V t rr I F = 0.75 A, -di/dt = 10 A/µs, 1.5 µs V DS = 25 V, VGS = -10V Pins: 1 - Gate 2 - Drain 3 - Source 4 - Drain Bottom Side TO-220 AD Dimensions Note 1: Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 % |
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