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ST72F324J2T6 Fiches technique(PDF) 116 Page - STMicroelectronics |
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ST72F324J2T6 Fiches technique(HTML) 116 Page - STMicroelectronics |
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116 / 156 page ![]() ST72324J/K 116/156 OPERATING CONDITIONS (Cont’d) 12.3.3 Operating Conditions with Low Voltage Detector (LVD) Subject to general operating conditions for VDD, fCPU, and TA. Notes: 1. Data based on characterization results, not tested in production. 2. When VtPOR is faster than 100 µs/V, the Reset signal is released after a delay of max. 42µs after VDD crosses the VIT+(LVD) threshold. 3. Applicable only in low voltage devices (planned). Figure 62. LVD Startup Behaviour Note: When the LVD is enabled, the MCU reaches its authorized operating voltage from a reset state. However, in some devices, the reset state is released when VDD is approximately between 0.8V and 1.5V. As a consequence, depending on the ramp-up speed, the I/Os may toggle when VDD is within this win- dow. This may be an issue especially for applications where the MCU drives power components. Because Flash write access is impossible within this window, the Flash memory contents will not be cor- rupted. Symbol Parameter Conditions Min Typ Max Unit VIT+(LVD) Reset release threshold (VDD rise) VD level = High in option byte 4.0 1) 4.2 4.5 V VD level = Med. in option byte3) VD level = Low in option byte3) 3.55 1) 2.95 1) 3.75 3.15 4.0 3.35 VIT-(LVD) Reset generation threshold (VDD fall) VD level = High in option byte 3.8 4.0 4.25 1) VD level = Med. in option byte3) VD level = Low in option byte3) 3.35 2.8 3.55 3.0 3.751) 3.15 1) Vhys(LVD) LVD voltage threshold hysteresis 1) VIT+(LVD)-VIT-(LVD) 150 200 250 mV VtPOR VDD rise time 1)2) 6 ∝ µs/V tg(VDD) Filtered glitch delay on VDD 1) Not detected by the LVD 40 ns 5V 1.5V VIT+ 0.8V LVD RESET V D D Window t |
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