General Description
The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Features
■ High performance BiCMOS technology
■ 25Ω series resistors in outputs eliminate the need for
   external terminating resistors
■ Dual output enable control signals
■ 3-STATE outputs for bus-oriented applications
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ IEEE 1149.1 (JTAG) Compliant
■ Includes CLAMP, IDCODE and HIGHZ instructions
■ Additional instructions SAMPLE-IN, SAMPLE-OUT and
   EXTEST-OUT
■ Power Up 3-STATE for hot insert
■ Member of Fairchild’s SCAN Products